Statistical Paradigms: Recent Advances and Reconciliations

Author(s): Sengupta Ashis
Publisher: World Scientific
ISBN: 9789814343954
Edition:

$39,99

Delivery: This can be downloaded Immediately after purchasing.
Version: Only PDF Version.
Compatible Devices: Can be read on any device (Kindle, NOOK, Android/IOS devices, Windows, MAC)
Quality: High Quality. No missing contents. Printable

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Description

Description

This volume consists of a collection of research articles on classical and emerging Statistical Paradigms — parametric, non-parametric and semi-parametric, frequentist and Bayesian — encompassing both theoretical advances and emerging applications in a variety of scientific disciplines. For advances in theory, the topics include: Bayesian Inference, Directional Data Analysis, Distribution Theory, Econometrics and Multiple Testing Procedures. The areas in emerging applications include: Bioinformatics, Factorial Experiments and Linear Models, Hotspot Geoinformatics and Reliability.

Statistical Paradigms: Recent Advances And Reconciliations

Author(s): Sengupta Ashis
Publisher: World Scientific
ISBN: 9789814343954
Edition:

$39,99

Delivery: This can be downloaded Immediately after purchasing.
Version: Only PDF Version.
Compatible Devices: Can be read on any device (Kindle, NOOK, Android/IOS devices, Windows, MAC)
Quality: High Quality. No missing contents. Printable

Recommended Software: Check here

Important: No Access Code

Description

Description

This volume consists of a collection of research articles on classical and emerging Statistical Paradigms — parametric, non-parametric and semi-parametric, frequentist and Bayesian — encompassing both theoretical advances and emerging applications in a variety of scientific disciplines. For advances in theory, the topics include: Bayesian Inference, Directional Data Analysis, Distribution Theory, Econometrics and Multiple Testing Procedures. The areas in emerging applications include: Bioinformatics, Factorial Experiments and Linear Models, Hotspot Geoinformatics and Reliability.